- Optimize your chip testing workflows with our advanced burn-in socket, designed specifically for the QFP64, LQFP64, and TQFP64 package chips. Experience consistent and reliable results every time. - Achieve precise testing and aging of your semiconductor chips with our burn-in socket, ensuring stability and reliability throughout the process. - Ideal for semiconductor engineers and electronic lab technicians, this tool is essential for anyone requiring professional-grade equipment for chip testing and aging. - Crafted for safety and accuracy, the socket's design facilitates efficient performance during prolonged aging tests, safeguarding both the chips and the testing environment. - Applications include: - Routine testing of electronic components in labs to ensure quality control. - Prolonged aging tests for durability assessment in semiconductor manufacturing. - Engineering prototyping where precise chip performance evaluation is critical. - The socket is compatible with multiple package types (QFP64, LQFP64, TQFP64), ensuring versatility in your testing procedures. - Constructed from high-quality materials, it provides durability and longevity, making it a reliable choice for ongoing testing needs.